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high resolution electron microscopy in Chinese

Pronunciation:
How to pronounce "high resolution electron microscopy""high resolution electron microscopy" in a sentence

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  • 高分辨電鏡

Examples

  • No87 : two - stage image processing in high resolution electron microscopy , f . h . li , proc . intern . congress on electron microscopy , paris ( 1994 ) vol . 1 , 481 - 4
    高分辨電子顯微術(shù)與電子衍射相結(jié)合測(cè)定晶體結(jié)構(gòu),李方華,自然科學(xué)進(jìn)展- - -國家重點(diǎn)實(shí)驗(yàn)室通訊, 3 ( 1993 ) 385 - 394
  • No142 : use of dynamical scattering in the structure determination of cebaite by high resolution electron microscopy , f . h . li and h . hashimoto , acta cryst . , b40 ( 1984 ) 454
    用直接法處理高分辨電子顯微像,范海福、鐘子洋、鄭朝德、李方華,電子顯微學(xué)報(bào), 3 ( 1984 ) no . 4 , 4 。
  • Saed ( selected area electron diffraction ) , hrem ( high resolution electron microscopy ) and eds ( energy dispersive spectrum ) experiments confirmed that both the porous layer and lamellar layer are composed of nano - crystalline ha ( hydroxyapatite )
    實(shí)驗(yàn)中采用了選區(qū)電子衍射、高分辨觀察和x - ray能譜等實(shí)驗(yàn)手段,分析了羥基磷灰石各層的形態(tài)、成分與微結(jié)構(gòu)。
  • The morphology and structure of ti - dlc films were investigated by high resolution electron microscopy ( hrem ) , atomic force microscopy ( afm ) , scanning electron microscopy ( sem ) and raman spectroscopy . the mechanical properties were investigated by a mts nano indenter xp system with a berkovich indenter . the ti - dlc film with a titanium content of 27at . %
    利用高分辨電子顯微鏡( hrem ) 、原子力顯微鏡( afm ) 、掃描電鏡( sem )和拉曼光譜儀等手段分析了沉積ti - dlc薄膜的成分、形貌和結(jié)構(gòu),使用帶berkovich壓頭的納米壓痕儀( mtsnanoindenterxp )測(cè)試了薄膜的力學(xué)性能。
  • More recent studies show nanowires products with narrow dismeter distribution around 5 - 10mn and lengths ranging from several hundred nanometers to several micrometers can be obtained if the mixture solution of naoh and koh was replaced by koh solution . the nanowires were analyzed by a range of methods including powder x - ray diffraction ( xrd ) , high resolution electron microscopy ( hrem ) , selected area electron diffraction ( saed ) , electron energy loss spectroscopy ( eels ) , xrd and hrem image simulations . the structure of nanowires is determinded to be of the type of k2ti6oi3
    利用x射線衍射( xri ) ) 、高分辨電子顯微鏡( hrtem ) 、選區(qū)電子衍射( saed ) 、電子能量損失譜( eels )以及x射線衍射和高分辨像模擬等分析測(cè)試手段,初步分析了這種納米線的生長機(jī)理,探討了她的結(jié)構(gòu)和光學(xué)性能,實(shí)驗(yàn)結(jié)果顯示這種納米線具有kzti6o ; 3的結(jié)構(gòu),紫外一可見光吸收光譜顯示, kzti6ol3納米線禁帶寬度約為3 . 45ev 。
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